Equipment Testing Usage Fees
Our facilities are available for both local and international users. The pricing is structured to provide affordable access for local researchers while maintaining competitive rates for international collaborations.
Payment Method
Payments can be made via e-Payment or manual transaction. Kindly refer to the provided instructions and submit proof of payment.
Testing Payment Procedure Using E-Payment Method
Testing Payment Procedure Using Grants For Sample Testing
Booking Forms
Our facilities are available for both local and international users. The pricing is structured to provide affordable access for local researchers while maintaining competitive rates for international collaborations.
Atomic Force Microscope (AFM) (Park System)
Atomic Force Microscope (AFM) (Hitachi)
Field Emission Scanning Electron Microscope (FESEM) and EDX
Raman Spectroscopy
Contact Angle
Surface Profiler
X-ray Diffraction (XRD) (Panalytical)
X-ray Diffraction (XRD) (Rigaku)
Nanoindenter Bruker Hysitron Ti Premiere
DC Sputter
Thermal Evaporator
RC & DC Sputtering System
Reactive Ion Etching
Hall Effect
4 Point Probe
UV - VIS
Semiconductor Device Parameter Analyzer (SPA) and Probe Station
Incident photon to current efficiency (IPCE)
Solar Simulator and 2 Point Probe
Muse Cell Analyzer
Centrifuge
Vacuum Oven
Oven
Other Document
Supporting resources and reference documents available for students and researchers. Click download to access the files.
| Items | Click Here! |
|---|---|
| MiNT-SRC Logo (A = medium size & B + small size) | Download A (Medium) |
| Download B (Small) | |
| Brochure MiNT-SRC | View Document |
| Testing Procedure in MiNT-SRC (UTHM) | View Document |
| Booking Form (FESEM) | View Document |
| Booking Form (Other Equipment) | View Document |
| UTHM Diploma/Bachelor/Master/PhD Student Project Claim Form (Internal) | View Document |
| QR CODE | View Document |