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Equipment Testing Usage Fees

Our facilities are available for both local and international users. The pricing is structured to provide affordable access for local researchers while maintaining competitive rates for international collaborations.

Local Customer

International Customer

Payment Method

Payments can be made via e-Payment or manual transaction. Kindly refer to the provided instructions and submit proof of payment.

Booking Forms

Our facilities are available for both local and international users. The pricing is structured to provide affordable access for local researchers while maintaining competitive rates for international collaborations.

Atomic Force Microscope (AFM) (Park System)

Atomic Force Microscope (AFM) (Hitachi)

Field Emission Scanning Electron Microscope (FESEM) and EDX

Raman Spectroscopy

Contact Angle

Surface Profiler

X-ray Diffraction (XRD) (Panalytical)

X-ray Diffraction (XRD) (Rigaku)

Nanoindenter Bruker Hysitron Ti Premiere

DC Sputter

Thermal Evaporator

RC & DC Sputtering System

Reactive Ion Etching

Hall Effect

4 Point Probe

UV - VIS

Semiconductor Device Parameter Analyzer (SPA) and Probe Station

Incident photon to current efficiency (IPCE)

Solar Simulator and 2 Point Probe

Muse Cell Analyzer

Centrifuge

Vacuum Oven

Oven

Other Document

Supporting resources and reference documents available for students and researchers. Click download to access the files.

Items Click Here!
MiNT-SRC Logo (A = medium size & B + small size) Download A (Medium)
Download B (Small)
Brochure MiNT-SRC View Document
Testing Procedure in MiNT-SRC (UTHM) View Document
Booking Form (FESEM) View Document
Booking Form (Other Equipment) View Document
UTHM Diploma/Bachelor/Master/PhD Student Project Claim Form (Internal) View Document
QR CODE View Document